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Atomic-force microscopy
Results: 458

#	Item
291	Fraunhofer Institute for Reliability and M i c r o i n t e g r at i o n I Z M Focused Ion Beam • Design parameter effect analysis (geometry, material, load profile) Add to Reading List Source URL: www.izm.fraunhofer.de Language: English - Date: 2015-02-12 09:57:08 Reliability Measuring instrument Thermomechanical analysis Failure analysis Electron microscope Dynamic mechanical analysis Atomic force microscopy Characterization MIL-STD-883 Science Materials science Scientific method
292	Friction, Adhesion, and Deformation: Dynamic Measurements with the Atomic Force Microscope Phil Attard Ian Wark Research Institute, University of South Australia, Mawson Lakes SA 5095 Australia (J. Adhesion Sci. Technol. Add to Reading List Source URL: personal.chem.usyd.edu.au Language: English - Date: 2003-08-20 22:30:41 Intermolecular forces Mechanical engineering Scanning probe microscopy Classical mechanics Friction Atomic force microscopy Contact mechanics Rail adhesion Surface forces apparatus Physics Chemistry Materials science
293	To appear in the IEEE/ASME Advanced Mechatronics Conference, Kobe, Japan, July[removed]High Aspect Ratio Polymer Micro/Nano-Structure Manufacturing using Nanoembossing, Nanomolding and Directed Self-Assembly Metin Sitti Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Materials science Microtechnology Intermolecular forces Emerging technologies Ion track Polymer Atomic force microscopy Electron microscope Metin Sitti Nanotechnology Science Scientific method
294	Macromolecular Materials and Engineering Role of organoclay in controlling the morphology and crystalgrowth behavior of biodegradable polymer-blend thin films studied using atomic force microscopy Thomas Malwela, Suprak Add to Reading List Source URL: researchspace.csir.co.za Language: English - Date: 2014-12-15 16:55:16 Synthetic fibers Bioplastics Polymers Materials science Polylactic acid Biodegradable polymer Crystal growth Chemistry Crystallography Matter
295	Two-Dimensional Fine Particle Positioning Under Optical Microscope Using a Piezoresistive Cantilever as a Manipulator Metin Sitti and Hideki Hashimoto Institute of Industrial Science, University of Tokyo, Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Chemistry Atomic force microscopy Nanotechnology Cantilever Force spectroscopy Magnetic force microscope Scanning probe microscopy Science Scientific method
296	Advanced Robotics Journal, Vol. X, No. Y, 2002 (to appear) SCALED TELEOPERATION SYSTEM FOR NANO SCALE INTERACTION AND MANIPULATION Metin Sitti,1,∗ Baris Aruk,2 Hirohaki Shintani2 and Hideki Hashimoto2 1 Mechanical Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Technology Atomic force microscopy Scanning tunneling microscope Haptic technology AFM probe Contact mechanics Test probe Piezoelectricity Photoconductive atomic force microscopy Scanning probe microscopy Science Scientific method
297	Teleoperated and Automatic Nanomanipulation Systems using Atomic Force Microscope Probes Metin Sitti Dept. of Mechanical Engineering and The Robotics Institute, Carnegie Mellon University [removed] Abstract Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Nanotechnology Intermolecular forces Atomic force microscopy Nanoindentation Nanoparticle Vibrational analysis with scanning probe microscopy Thermal Probe Lithography Scanning probe microscopy Science Scientific method
298	IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 5, NO. 2, JUNE[removed]Controlled Pushing of Nanoparticles: Modeling and Experiments Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:36 Nanotechnology Intermolecular forces Atomic force microscopy Nanoparticle Electron Magnetic force microscope Local oxidation nanolithography Scanning probe microscopy Physics Science
299	1 Proximal Probes based Nanorobotic Drawing of Polymer Micro/Nanofibers Amrinder S. Nain, Cristina Amon, Fellow, IEEE, and Metin Sitti, Member, IEEE Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Nanotechnology Electrospinning Nanomaterials Polymers Composite materials Fiber Nanofiber Atomic force microscopy Polyethylene terephthalate Chemistry Materials science Manufacturing
300	IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 8, NO. 3, SEPT[removed]Atomic Force Microscope Probe based Controlled Pushing for Nano-Tribological Characterization Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Classical mechanics Force Introductory physics Nanotechnology Atomic force microscopy AFM probe Friction Sliding Scanning probe microscopy Physics Science Mechanical engineering

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